Yung-Yuan Chen, Shambhu J. Upadhyaya. Modeling the Reliability of a Class of Fault-Tolerant VLSI/WSI Systems Based on Multiple-Level Redundancy. IEEE Transactions on Computers, 43(6):737-748, 1994.
@article{ChenU94:0,
title = {Modeling the Reliability of a Class of Fault-Tolerant VLSI/WSI Systems Based on Multiple-Level Redundancy},
author = {Yung-Yuan Chen and Shambhu J. Upadhyaya},
year = {1994},
tags = {redundancy, modeling, reliability},
researchr = {https://researchr.org/publication/ChenU94%3A0},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {43},
number = {6},
pages = {737-748},
}