Modeling the Reliability of a Class of Fault-Tolerant VLSI/WSI Systems Based on Multiple-Level Redundancy

Yung-Yuan Chen, Shambhu J. Upadhyaya. Modeling the Reliability of a Class of Fault-Tolerant VLSI/WSI Systems Based on Multiple-Level Redundancy. IEEE Transactions on Computers, 43(6):737-748, 1994.

Abstract

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