Suyuan Chen, Ranga Vemuri. On the Effectiveness of the Satisfiability Attack on Split Manufactured Circuits. In IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8-10, 2018. pages 83-88, IEEE, 2018. [doi]
@inproceedings{ChenV18-3,
title = {On the Effectiveness of the Satisfiability Attack on Split Manufactured Circuits},
author = {Suyuan Chen and Ranga Vemuri},
year = {2018},
doi = {10.1109/VLSI-SoC.2018.8644963},
url = {https://doi.org/10.1109/VLSI-SoC.2018.8644963},
researchr = {https://researchr.org/publication/ChenV18-3},
cites = {0},
citedby = {0},
pages = {83-88},
booktitle = {IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8-10, 2018},
publisher = {IEEE},
isbn = {978-1-5386-4756-1},
}