Efficient numerical modeling of random rough surface effects for interconnect internal impedance extraction - researchr publication authors

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Quan Chen, Ngai Wong. Efficient numerical modeling of random rough surface effects for interconnect internal impedance extraction. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 152-157, IEEE, 2008. [doi]

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