Chih Hung Chen, Ying-Lien Wang, M. H. Bakr, Zheng Zeng. Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements. IEEE T. Instrumentation and Measurement, 57(11):2462-2471, 2008. [doi]
@article{ChenWBZ08,
title = {Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements},
author = {Chih Hung Chen and Ying-Lien Wang and M. H. Bakr and Zheng Zeng},
year = {2008},
doi = {10.1109/TIM.2008.925021},
url = {http://dx.doi.org/10.1109/TIM.2008.925021},
researchr = {https://researchr.org/publication/ChenWBZ08},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {57},
number = {11},
pages = {2462-2471},
}