Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements

Chih Hung Chen, Ying-Lien Wang, M. H. Bakr, Zheng Zeng. Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements. IEEE T. Instrumentation and Measurement, 57(11):2462-2471, 2008. [doi]

Abstract

Abstract is missing.