Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration

Kuo-Ming Chen, J. D. Wu, Kuo-Ning Chiang. Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration. Microelectronics Reliability, 46(12):2104-2111, 2006. [doi]

Authors

Kuo-Ming Chen

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J. D. Wu

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Kuo-Ning Chiang

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