Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration

Kuo-Ming Chen, J. D. Wu, Kuo-Ning Chiang. Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration. Microelectronics Reliability, 46(12):2104-2111, 2006. [doi]

Abstract

Abstract is missing.