Zhenxiang Chen, Hironori Washizaki, Yoshiaki Fukazawa. Automated Tool for Revising Masking MC/DC Test Suite. In 2020 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Coimbra, Portugal, October 12-15, 2020. pages 157-158, IEEE, 2020. [doi]
Abstract is missing.