Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling

H. T. Chen, C. Q. Wang, M. Y. Li. Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling. Microelectronics Reliability, 46(8):1348-1356, 2006. [doi]

Authors

H. T. Chen

This author has not been identified. Look up 'H. T. Chen' in Google

C. Q. Wang

This author has not been identified. Look up 'C. Q. Wang' in Google

M. Y. Li

This author has not been identified. Look up 'M. Y. Li' in Google