Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling

H. T. Chen, C. Q. Wang, M. Y. Li. Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling. Microelectronics Reliability, 46(8):1348-1356, 2006. [doi]

Abstract

Abstract is missing.