Ling Chen, Yaman Wang, Yuchen Long, Zengfeng Duan, Yanyan Li. Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products. In 6th International Conference on Universal Village, UV 2022, Boston, MA, USA, October 22-25, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{ChenWLDL22,
title = {Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products},
author = {Ling Chen and Yaman Wang and Yuchen Long and Zengfeng Duan and Yanyan Li},
year = {2022},
doi = {10.1109/UV56588.2022.10185477},
url = {https://doi.org/10.1109/UV56588.2022.10185477},
researchr = {https://researchr.org/publication/ChenWLDL22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {6th International Conference on Universal Village, UV 2022, Boston, MA, USA, October 22-25, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7477-1},
}