Ling Chen, Yaman Wang, Yuchen Long, Zengfeng Duan, Yanyan Li. Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products. In 6th International Conference on Universal Village, UV 2022, Boston, MA, USA, October 22-25, 2022. pages 1-7, IEEE, 2022. [doi]
Abstract is missing.