Hongxia Chen, Sufen Wei, Jing Liu, Guohe Zhang, Cheng-Fu Yang. A Physical Threshold Voltage Model of Nanoscale Ultra-thin Body Ultra-thin Box SOI MOSFETs with a Gaussian Doping Profile. In IEEE 2nd International Conference on Knowledge Innovation and Invention, ICKII 2019, Seoul, Korea (South), July 12-15, 2019. pages 89-92, IEEE, 2019. [doi]
Abstract is missing.