On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques - researchr publication authors

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Zhanping Chen, Liqiong Wei, Kaushik Roy. On Effective IDDQ Testing of Low Voltage CMOS Circuits Using Leakage Control Techniques. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 181-188, IEEE Computer Society, 2000. [doi]

This author has not been identified. Look up 'Zhanping Chen' in GoogleThis author has not been identified. Look up 'Liqiong Wei' in GoogleThis author has not been identified. Look up 'Kaushik Roy' in Google

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