TXL-Fuzz: A Long Attention Mechanism-Based Fuzz Testing Model for Industrial IoT Protocols

Liangyin Chen, Yihan Wang, Xuanyi Xiang, Dian Jin, Yi Ren, Yunhai Zhang, Zhiwen Pan, Yanru Chen 0001. TXL-Fuzz: A Long Attention Mechanism-Based Fuzz Testing Model for Industrial IoT Protocols. IEEE Internet of Things Journal, 11(23):38238-38245, December 2024. [doi]

Abstract

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