Feature Selection for Chip Defect Identification Using the Pied Kingfisher Algorithm

Kai Chen, Wenxiu Wang, Zhisheng Zhang. Feature Selection for Chip Defect Identification Using the Pied Kingfisher Algorithm. In 30th International Conference on Mechatronics and Machine Vision in Practice, M2VIP 2024, Leeds, United Kingdom, October 3-5, 2024. pages 1-5, IEEE, 2024. [doi]

Abstract

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