Zhichao Chen, Yang Xiao, Li Du, Yuan Du. Characterization of Charge-Trap-Transistor (CTT) Threshold Voltage Degradation and Differential-Pair-Based Memory Design. In IEEE International Symposium on Circuits and Systems, ISCAS 2023, Monterey, CA, USA, May 21-25, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.