Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material

Chun-Ping Chen, Deming Xu, Zhewang Ma, Tetsuo Anada. Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material. IEICE Transactions, 90-C(9):1763-1769, 2007. [doi]

@article{ChenXMA07,
  title = {Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material},
  author = {Chun-Ping Chen and Deming Xu and Zhewang Ma and Tetsuo Anada},
  year = {2007},
  doi = {10.1093/ietele/e90-c.9.1763},
  url = {http://dx.doi.org/10.1093/ietele/e90-c.9.1763},
  tags = {rule-based},
  researchr = {https://researchr.org/publication/ChenXMA07},
  cites = {0},
  citedby = {0},
  journal = {IEICE Transactions},
  volume = {90-C},
  number = {9},
  pages = {1763-1769},
}