Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material

Chun-Ping Chen, Deming Xu, Zhewang Ma, Tetsuo Anada. Further Study on Coaxial-Probe-Based Two-Thickness-Method for Nondestructive and Broadband Measurement of Complex EM-parameters of Absorbing Material. IEICE Transactions, 90-C(9):1763-1769, 2007. [doi]

Abstract

Abstract is missing.