Zhenqiang Chen, Baowen Xu, Hongji Yang. Test Coverage Analysis Based on Program Slicing. In Proceedings of the 2003 IEEE International Conference on Information Reuse and Integration, IRI - 2003, October 27-29, 2003, Las Vegas, NV, USA. pages 559-565, IEEE Systems, Man, and Cybernetics Society, 2003.
Abstract is missing.