PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices

Fu-Hsin Chen, Ming-Chang Yang, Yuan-Hao Chang, Tei-Wei Kuo. PWL: a progressive wear leveling to minimize data migration overheads for nand flash devices. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1209-1212, ACM, 2015. [doi]

Abstract

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