3Sn through molecular dynamics simulation and nanoindentation testing

Wen-Hwa Chen, Ching-Feng Yu, Hsien-Chie Cheng, Su-Tsai Lu. 3Sn through molecular dynamics simulation and nanoindentation testing. Microelectronics Reliability, 52(8):1699-1710, 2012. [doi]

Authors

Wen-Hwa Chen

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Ching-Feng Yu

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Hsien-Chie Cheng

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Su-Tsai Lu

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