3Sn through molecular dynamics simulation and nanoindentation testing

Wen-Hwa Chen, Ching-Feng Yu, Hsien-Chie Cheng, Su-Tsai Lu. 3Sn through molecular dynamics simulation and nanoindentation testing. Microelectronics Reliability, 52(8):1699-1710, 2012. [doi]

Abstract

Abstract is missing.