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Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels

Pengfei Chen, Junjie Ye, Guangyong Chen, Jingwei Zhao, Pheng-Ann Heng. Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels. In Thirty-Fifth AAAI Conference on Artificial Intelligence, AAAI 2021, Thirty-Third Conference on Innovative Applications of Artificial Intelligence, IAAI 2021, The Eleventh Symposium on Educational Advances in Artificial Intelligence, EAAI 2021, Virtual Event, February 2-9, 2021. pages 11451-11461, AAAI Press, 2021. [doi]

Authors

Pengfei Chen

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Junjie Ye

This author has not been identified. Look up 'Junjie Ye' in Google

Guangyong Chen

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Jingwei Zhao

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Pheng-Ann Heng

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