Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels

Pengfei Chen, Junjie Ye, Guangyong Chen, Jingwei Zhao, Pheng-Ann Heng. Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels. In Thirty-Fifth AAAI Conference on Artificial Intelligence, AAAI 2021, Thirty-Third Conference on Innovative Applications of Artificial Intelligence, IAAI 2021, The Eleventh Symposium on Educational Advances in Artificial Intelligence, EAAI 2021, Virtual Event, February 2-9, 2021. pages 11451-11461, AAAI Press, 2021. [doi]

@inproceedings{ChenYCZH21a,
  title = {Robustness of Accuracy Metric and its Inspirations in Learning with Noisy Labels},
  author = {Pengfei Chen and Junjie Ye and Guangyong Chen and Jingwei Zhao and Pheng-Ann Heng},
  year = {2021},
  url = {https://ojs.aaai.org/index.php/AAAI/article/view/17364},
  researchr = {https://researchr.org/publication/ChenYCZH21a},
  cites = {0},
  citedby = {0},
  pages = {11451-11461},
  booktitle = {Thirty-Fifth AAAI Conference on Artificial Intelligence, AAAI 2021, Thirty-Third Conference on Innovative Applications of Artificial Intelligence, IAAI 2021, The Eleventh Symposium on Educational Advances in Artificial Intelligence, EAAI 2021, Virtual Event, February 2-9, 2021},
  publisher = {AAAI Press},
  isbn = {978-1-57735-866-4},
}