Gao Chen, Han Yu, Linhua Jiang, Huiliang Shang. Few-Shot Learning on 3D Surface Defect Detection with PM Networks. In AIAM 2021: 3rd International Conference on Artificial Intelligence and Advanced Manufacture, Manchester, United Kingdom, October 23 - 25, 2021. pages 104-108, ACM, 2021. [doi]
Abstract is missing.