Patch Matching for Few-Shot Industrial Defect Detection

Ruiyun Chen, Guitao Yu, Zhen Qin, Kangkang Song, Jianfei Tu, Xianliang Jiang, Dan Liang, Chengbin Peng. Patch Matching for Few-Shot Industrial Defect Detection. IEEE T. Instrumentation and Measurement, 73:1-11, 2024. [doi]

Abstract

Abstract is missing.