Conflict driven scan chain configuration for high transition fault coverage and low test power - researchr publication authors

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Zhen Chen, Boxue Yin, Dong Xiang. Conflict driven scan chain configuration for high transition fault coverage and low test power. In Proceedings of the 14th Asia South Pacific Design Automation Conference, ASP-DAC 2009, Yokohama, Japan, January 19-22, 2009. pages 666-671, IEEE, 2009. [doi]

This author has not been identified. Look up 'Zhen Chen' in GoogleThis author has not been identified. Look up 'Boxue Yin' in GoogleThis author has not been identified. Look up 'Dong Xiang' in Google

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