Shen-Li Chen, Chih-Hung Yang, Chih-Ying Yen, Kuei-Jyun Chen, Yi-Cih Wu, Jia-Ming Lin. Design on ESD robustness of source-side discrete distribution in the 60-V high-voltage nLDMOS devices. In IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016, Nantou County, Taiwan, May 27-29, 2016. pages 1-2, IEEE, 2016. [doi]
Abstract is missing.