R. M. Chen, E. X. Zhang, B. L. Bhuva. Single-event performance of differential flip-flop designs and hardening implication. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 221-226, IEEE, 2016. [doi]
@inproceedings{ChenZB16,
title = {Single-event performance of differential flip-flop designs and hardening implication},
author = {R. M. Chen and E. X. Zhang and B. L. Bhuva},
year = {2016},
doi = {10.1109/IOLTS.2016.7604707},
url = {http://dx.doi.org/10.1109/IOLTS.2016.7604707},
researchr = {https://researchr.org/publication/ChenZB16},
cites = {0},
citedby = {0},
pages = {221-226},
booktitle = {22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1507-8},
}