Haiyong Chen, Huifang Zhao, Da Han, Haowei Yan, Xiaofang Zhang, Kun Liu. Robust Crack Defect Detection in Inhomogeneously Textured Surface of Near Infrared Images. In Jian-Huang Lai, Cheng-Lin Liu, Xilin Chen, Jie Zhou 0001, Tieniu Tan, Nanning Zheng, Hongbin Zha, editors, Pattern Recognition and Computer Vision - First Chinese Conference, PRCV 2018, Guangzhou, China, November 23-26, 2018, Proceedings, Part I. Volume 11256 of Lecture Notes in Computer Science, pages 511-523, Springer, 2018. [doi]
Abstract is missing.