Zhuangzhuang Chen, Jin Zhang, Zhuonan Lai, Guanming Zhu, Zun Liu, Jie Chen, Jianqiang Li 0001. The Devil is in the Crack Orientation: A New Perspective for Crack Detection. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 6630-6640, IEEE, 2023. [doi]
Abstract is missing.