Yipeng Chen, Cairong Zhao, Tianli Sun. Single Image Based Metric Learning via Overlapping Blocks Model for Person Re-Identification. In IEEE Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2019, Long Beach, CA, USA, June 16-20, 2019. pages 647-656, Computer Vision Foundation / IEEE, 2019. [doi]
Abstract is missing.