Zesheng Chen, Yuan Zhang, Chaoqun Shen. A reconfigurable MRAM PUF with high reliability. Microelectronics Journal, 163:106745, 2025. [doi]
@article{ChenZS25-6,
title = {A reconfigurable MRAM PUF with high reliability},
author = {Zesheng Chen and Yuan Zhang and Chaoqun Shen},
year = {2025},
doi = {10.1016/j.mejo.2025.106745},
url = {https://doi.org/10.1016/j.mejo.2025.106745},
researchr = {https://researchr.org/publication/ChenZS25-6},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {163},
pages = {106745},
}