Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Yilin Chen, Qing Zhu, Jie-Jie Zhu, Minhan Mi, Meng Zhang, Yuwei Zhou, Ziyue Zhao, Xiaohua Ma, Yue Hao. Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light. Science in China Series F: Information Sciences, 66(2), February 2023. [doi]

This author has not been identified. Look up 'Yilin Chen' in GoogleThis author has not been identified. Look up 'Qing Zhu' in GoogleThis author has not been identified. Look up 'Jie-Jie Zhu' in GoogleThis author has not been identified. Look up 'Minhan Mi' in GoogleThis author has not been identified. Look up 'Meng Zhang' in GoogleThis author has not been identified. Look up 'Yuwei Zhou' in GoogleThis author has not been identified. Look up 'Ziyue Zhao' in GoogleThis author has not been identified. Look up 'Xiaohua Ma' in GoogleThis author has not been identified. Look up 'Yue Hao' in Google

runs on WebDSL