Yilin Chen, Qing Zhu, Jie-Jie Zhu, Minhan Mi, Meng Zhang, Yuwei Zhou, Ziyue Zhao, Xiaohua Ma, Yue Hao. Degradation induced by holes in Si3N4/AlGaN/GaN MIS HEMTs under off-state stress with UV light. Science in China Series F: Information Sciences, 66(2), February 2023. [doi]
Abstract is missing.