Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley. Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. In Karine Heydemann, Ulrich Kühne, Letitia Li, editors, Proceedings of 8th International Workshop on Security Proofs for Embedded Systems, PROOFS 2019, colocated with CHES 2018, Atlanta, GA, USA, August 24, 2019. Volume 11 of Kalpa Publications in Computing, pages 17-32, EasyChair, 2019. [doi]
Abstract is missing.