Detecting Faults in Inner Product Masking Scheme - IPM-FD: IPM with Fault Detection

Wei Cheng, Claude Carlet, Kouassi Goli, Sylvain Guilley, Jean-Luc Danger. Detecting Faults in Inner Product Masking Scheme - IPM-FD: IPM with Fault Detection. IACR Cryptology ePrint Archive, 2019:919, 2019. [doi]

Abstract

Abstract is missing.