Retraction Note: Capacitance pin defect detection based on deep learning

Cheng Cheng, Ning Dai, Jie Huang, Yahong Zhuang, Tao Tang, Longlong Liu. Retraction Note: Capacitance pin defect detection based on deep learning. J. Comb. Optim., 47(3):30, April 2024. [doi]

Abstract

Abstract is missing.