Capturing intrinsic parameter fluctuations using the PSP compact model - researchr publication authors

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Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov. Capturing intrinsic parameter fluctuations using the PSP compact model. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 650-653, IEEE, 2010. [doi]

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