Reliability analysis of interconnects at edge tier in datacenters

Yuxin Cheng, Matteo Fiorani, Lena Wosinska, Jiajia Chen 0001. Reliability analysis of interconnects at edge tier in datacenters. In 17th International Conference on Transparent Optical Networks, ICTON 2015, Budapest, Hungary, July 5-9, 2015. pages 1, IEEE, 2015. [doi]

Abstract

Abstract is missing.