Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network - researchr publication authors

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Long Cheng, Ping Gong, Guanghui Qiu, Jing Wang, Ziyuan Liu. Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network. In Zhouchen Lin, Liang Wang 0001, Jian Yang 0003, Guangming Shi, Tieniu Tan, Nanning Zheng, Xilin Chen, Yanning Zhang, editors, Pattern Recognition and Computer Vision - Second Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019, Proceedings, Part III. Volume 11859 of Lecture Notes in Computer Science, pages 366-377, Springer, 2019. [doi]

This author has not been identified. Look up 'Long Cheng' in GoogleThis author has not been identified. Look up 'Ping Gong' in GoogleThis author has not been identified. Look up 'Guanghui Qiu' in GoogleThis author has not been identified. Look up 'Jing Wang' in GoogleThis author has not been identified. Look up 'Ziyuan Liu' in Google

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