Long Cheng, Ping Gong, Guanghui Qiu, Jing Wang, Ziyuan Liu. Small Defect Detection in Industrial X-Ray Using Convolutional Neural Network. In Zhouchen Lin, Liang Wang 0001, Jian Yang 0003, Guangming Shi, Tieniu Tan, Nanning Zheng, Xilin Chen, Yanning Zhang, editors, Pattern Recognition and Computer Vision - Second Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019, Proceedings, Part III. Volume 11859 of Lecture Notes in Computer Science, pages 366-377, Springer, 2019. [doi]
Abstract is missing.