Applying ICA monitoring and profile monitoring to statistical process control of manufacturing variability at multiple locations within the same unit

Chuen-Sheng Cheng, Kuo-Ko Huang. Applying ICA monitoring and profile monitoring to statistical process control of manufacturing variability at multiple locations within the same unit. Int. J. Computer Integrated Manufacturing, 27(11):1055-1066, 2014. [doi]

@article{ChengH14-7,
  title = {Applying ICA monitoring and profile monitoring to statistical process control of manufacturing variability at multiple locations within the same unit},
  author = {Chuen-Sheng Cheng and Kuo-Ko Huang},
  year = {2014},
  doi = {10.1080/0951192X.2013.874579},
  url = {http://dx.doi.org/10.1080/0951192X.2013.874579},
  researchr = {https://researchr.org/publication/ChengH14-7},
  cites = {0},
  citedby = {0},
  journal = {Int. J. Computer Integrated Manufacturing},
  volume = {27},
  number = {11},
  pages = {1055-1066},
}