Heat dissipation assessment of through silicon via (TSV)-based 3D IC packaging for CMOS image sensing

Hsien-Chie Cheng, Tzu-Chin Huang, Po-Wen Hwang, Wen-Hwa Chen. Heat dissipation assessment of through silicon via (TSV)-based 3D IC packaging for CMOS image sensing. Microelectronics Reliability, 59:84-94, 2016. [doi]

Abstract

Abstract is missing.