Temperature-driven power and timing analysis for CMOS ULSI circuits

Yi-Kan Cheng, Sung-Mo Kang. Temperature-driven power and timing analysis for CMOS ULSI circuits. In International Symposium on Circuits and Systems (ISCAS 1999), May 30 - June 2, 1999, Orlando, Florida, USA. pages 214-217, IEEE, 1999. [doi]

@inproceedings{ChengK99:0,
  title = {Temperature-driven power and timing analysis for CMOS ULSI circuits},
  author = {Yi-Kan Cheng and Sung-Mo Kang},
  year = {1999},
  doi = {10.1109/ISCAS.1999.780133},
  url = {http://doi.ieeecomputersociety.org/10.1109/ISCAS.1999.780133},
  tags = {analysis},
  researchr = {https://researchr.org/publication/ChengK99%3A0},
  cites = {0},
  citedby = {0},
  pages = {214-217},
  booktitle = {International Symposium on Circuits and Systems (ISCAS 1999), May 30 - June 2, 1999, Orlando, Florida, USA},
  publisher = {IEEE},
  isbn = {0-7803-5471-0},
}