An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology

Chi-Hsuan Cheng, James Chien-Mo Li. An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology. J. Electronic Testing, 27(2):193-201, 2011. [doi]

@article{ChengL11-1,
  title = {An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology},
  author = {Chi-Hsuan Cheng and James Chien-Mo Li},
  year = {2011},
  doi = {10.1007/s10836-011-5195-x},
  url = {http://dx.doi.org/10.1007/s10836-011-5195-x},
  tags = {testing, design},
  researchr = {https://researchr.org/publication/ChengL11-1},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {27},
  number = {2},
  pages = {193-201},
}