Kai Cheng, Qiang Li, Lei Wang, Qian Chen, Yaowen Zheng, Limin Sun, Zhenkai Liang. DTaint: Detecting the Taint-Style Vulnerability in Embedded Device Firmware. In 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018, Luxembourg City, Luxembourg, June 25-28, 2018. pages 430-441, IEEE Computer Society, 2018. [doi]
@inproceedings{ChengLWCZSL18,
title = {DTaint: Detecting the Taint-Style Vulnerability in Embedded Device Firmware},
author = {Kai Cheng and Qiang Li and Lei Wang and Qian Chen and Yaowen Zheng and Limin Sun and Zhenkai Liang},
year = {2018},
doi = {10.1109/DSN.2018.00052},
url = {http://doi.ieeecomputersociety.org/10.1109/DSN.2018.00052},
researchr = {https://researchr.org/publication/ChengLWCZSL18},
cites = {0},
citedby = {0},
pages = {430-441},
booktitle = {48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018, Luxembourg City, Luxembourg, June 25-28, 2018},
publisher = {IEEE Computer Society},
isbn = {978-1-5386-5596-2},
}