Kai Cheng, Qiang Li, Lei Wang, Qian Chen, Yaowen Zheng, Limin Sun, Zhenkai Liang. DTaint: Detecting the Taint-Style Vulnerability in Embedded Device Firmware. In 48th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2018, Luxembourg City, Luxembourg, June 25-28, 2018. pages 430-441, IEEE Computer Society, 2018. [doi]
Abstract is missing.